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Wafer measuring equipment

Alignment measurement of overlay in semiconductor production

High sensitivity、Process adaptability、Superior CoO、User-friendly、Factory automation

CharacteristicScene

High sensitivity:high performance imaging system with high NA and low aberration are adopted.

Process adaptability:Wide spectrum light source and polarization can be added, which has good process adaptability for FinFET process.

Superior CoO:Ultra-precision high-speed motion platformare coupledwith high performance measurement method.

User-friendly: Automatic measurement mode selection and automatic prescription generation are available, so that prescription generation time ca n greatly saved.

Factory automation: It supportsSECS/GEM SEMI standard, which can fully meet the requirements of factory automation.

    WeChat official account

      • 合肥地址:安徽省合肥市高新區(qū)華佗巷469號(hào)1號(hào)樓
        上海地址:中國(上海)自由貿(mào)易試驗(yàn)區(qū)祖沖之路899號(hào)11棟
        合肥電話:0551-65116087
        上海電話:021-50935077
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